National Instruments Corporation 865387-05

ECU TEST SYSTEM 40U FOR IDB GEN 2.0-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-07

ECU TEST SYSTEM 40U FOR MANDO INTEGRATED DYNAMIC BRAKE 2.0-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-15

ECU TEST SYSTEM 40U FOR DIDI BMS 0317-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-62

ECU TEST SYSTEM 40U FOR BMU+CMC-INLAB-01DUT

Open Market / 55 Days

National Instruments Corporation 865387-51

NI ECUTS 16001-ECU TEST SYSTEM 40U FOR FORD BMS-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-56

ECU TEST SYSTEM 40U FOR BMS V6-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-19

ECU TEST SYSTEM 40U FOR BMW-SMALL WITH DAQ-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-31

NI ECUTS 16001-ECU TEST SYSTEM 40U FOR GM BMS NOCELL-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-32

NI ECUTS 16001- ECU TEST SYSTEM 40U FOR GM BMS CELLSIM-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-37

ECU TEST SYSTEM 40U FOR TTC500_AND_6_OTHER_FULL_V2-01DUT

Open Market / 55 Days

National Instruments Corporation 865387-39

NI ECUTS 16001 - ECU TEST SYSTEM 40U FOR CLONE_426-00DUT

Open Market / 55 Days

National Instruments Corporation 868106-07B

NI STATIC TEST, 7X8 SLOT CHASSIS, 448 CH STRAIN 120 OHM, BASE, ASSM

Open Market / 55 Days

National Instruments Corporation 868106-07C

NI STATIC TEST, 7X8 SLOT CHASSIS, 448 CH STRAIN 120 OHM, BASE, UNASSM

Open Market / 55 Days

National Instruments Corporation 865387-40

NI ECUTS 16001-ECU TEST SYSTEM 40U FOR HMC800 HFT++ MULTI-DUT

Open Market / 55 Days

National Instruments Corporation 868106-09B

NI STATIC TEST, 7X8 SLOT CHASSIS, 896 CH TEMPERATURE, BASE, ASSM

Open Market / 55 Days

National Instruments Corporation 865387-33

NI ECUTS 16001-ECU TEST SYSTEM 40U FOR EPF4 BFT-02DUT

Open Market / 55 Days

National Instruments Corporation 865387-45

ECU TEST SYSTEM 40U FOR HMC800V RUNIN V2-03DUT

Open Market / 55 Days

National Instruments Corporation 865387-47

ECU TEST SYSTEM 40U FOR IDB2.0_P-LOCK-01DUT

Open Market / 55 Days

National Instruments Corporation 865387-64

ECU TEST SYSTEM 40U FOR BMU+CMC-INLAB-01DUT

Open Market / 55 Days

National Instruments Corporation 865387-58

ECU TEST SYSTEM 40U FOR BMU+CMC-INLAB-01DUT

Open Market / 55 Days

National Instruments Corporation 868106-08B

NI STATIC TEST, 7X8 SLOT CHASSIS, 448 CH STRAIN 350 OHM, BASE, ASSM

Open Market / 55 Days

National Instruments Corporation 868106-08C

NI STATIC TEST, 7X8 SLOT CHASSIS, 448 CH STRAIN 350 OHM, BASE, UNASSM

Open Market / 55 Days

National Instruments Corporation 868106-09C

NI STATIC TEST, 7X8 SLOT CHASSIS, 896 CH TEMPERATURE, BASE, UNASSM

Open Market / 55 Days

National Instruments Corporation 863218-01

CCS, CELL AND MODULE QUALITY TEST SYSTEM 15U RACK HARDWARE FOR EECOPOWER

Open Market / 55 Days

National Instruments Corporation 865978-56

CCS, ECU TEST SYSTEM 24U FOR SGW-PFCU-01DUT

Open Market / 55 Days

National Instruments Corporation 875057-01

CCS,ECU TEST SYSTEM 40U FOR FORD BMS-02DUT

Open Market / 55 Days

National Instruments Corporation 875081-01

CCS,ECU TEST SYSTEM 40U FOR FORD DEVELOPMENT BMS-01DUT

Open Market / 55 Days

National Instruments Corporation 861009-38

NI-STAR 700 SERIES TEST PLATFORM_VITESCO TECHNOLOGIES KOREA

Open Market / 55 Days

National Instruments Corporation 861009-37

NI-STAR 700 SERIES TEST PLATFORM V2.0 HTS HYUNDAI 2DUT

Open Market / 55 Days

National Instruments Corporation 865978-44

NI ECUTS 16000 - ECU TEST SYSTEM 24U FOR CDM-03DUT

Open Market / 55 Days

National Instruments Corporation 865978-48

NI ECUTS 16000-ECU TEST SYSTEM 24U FOR CDMV6-03DUT

Open Market / 55 Days

National Instruments Corporation 865978-52

NI ECUTS-16000 ECU TEST SYSTEM 24U FOR CBC3-01DUT

Open Market / 55 Days

National Instruments Corporation 865978-53

ECU TEST SYSTEM 24U FOR M2BEV, M3GEN2 INVERTERS-01DUT

Open Market / 55 Days

National Instruments Corporation 865978-41

ECU TEST SYSTEM 24U FOR VW_TVEMID_ECU_EOL-06DUT

Open Market / 55 Days

National Instruments Corporation 865978-42

ECU TEST SYSTEM 24U FOR VW_TVEMID_SATCAMS_EOL-06DUT

Open Market / 55 Days

National Instruments Corporation 865978-51

NI ECUTS-16000 ECU TEST SYSTEM 24U FOR CBC3-01DUT

Open Market / 55 Days

National Instruments Corporation 865978-50

NI ECUTS-16000 ECU TEST SYSTEM 24U FOR BV3_V2-02DUT

Open Market / 55 Days

Anritsu MX787311NR-081

Supplementary TRx Test Cases PKG1 for T-Mobile

Open Market / 6 Weeks

National Instruments Corporation 866142-01

NI STS T1M2 DX FOR ADC/DAC TEST

Open Market / 55 Days

Anritsu MX787321NR-081

Supplementary TRx Test Cases PKG1 for T-Mobile

Open Market / 6 Weeks

Anritsu MX787371NR-071

Supplementary TRx Test Cases for AT&T Package2

Open Market / 6 Weeks

Anritsu MX787340LA-017

Band66 InterBand RRM Test Cases1

Open Market / 6 Weeks

Anritsu MX787361LA-078

Performance Test Cases with 4Rx (1-2 Layer)

Open Market / 6 Weeks

Anritsu MX787312LA-041

TRX Test Cases CO/U for UL64QAM

Open Market / 6 Weeks

VTI Instruments 70-0403-000

F/A, Norm / Self-test Adapter Gen II 18 GHz

Open Market / 16 Weeks

National Instruments Corporation 868170-01B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

Open Market / 55 Days

National Instruments Corporation 868170-01CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

Open Market / 55 Days

National Instruments Corporation 868170-02CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 6 CH CONFIG,...

Open Market / 55 Days

National Instruments Corporation 868170-01C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

Open Market / 55 Days

National Instruments Corporation 868170-02C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 6 CH...

Open Market / 55 Days